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Yasuhito Yagi
Yasuhito Yagi
Time-dependent gate oxide breakdown
Copper
Metallurgy
Forensic engineering
Materials science
2
Papers
7
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0
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Copper Oxidization Formation Analysis for Improving TDDB Reliability
2011
Yohei Yamada
Yasuhito Yagi
Nobuhiro Konishi
Naohito Ogiso
Kiyomi Katsuyama
Shoji Asaka
Junji Noguchi
Tadakazu Miyazaki
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Analysis of Post-Chemical-Mechanical-Polishing Cleaning Mechanisms for Improving Time-Dependent Dielectric Breakdown Reliability
2008
Journal of The Electrochemical Society
Yohei Yamada
Yasuhito Yagi
Nobuhiro Konishi
Naohito Ogiso
Kiyomi Katsuyama
Shoji Asaka
Junji Noguchi
Tadakazu Miyazaki
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Citations (7)
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