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H. Uemura
H. Uemura
Mitsubishi Electric
Electrical engineering
Engineering
Voltage
Computational physics
Failure rate
2
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5
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0
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Tight relationship among field failure rate, single event burn-out (SEB) and cold bias stability (CBS) as a cosmic ray endurance for IGBT and diode
2018
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Kenji Suzuki
Yasuhiro Yoshiura
K. Uryu
Tadaharu Minato
Masayoshi Tarutani
Y. Miyazaki
H. Uemura
T. Hagihara
S. Momii
Y. Kusakabe
M. Nakamura
Y. Fujita
K. Takakura
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Citations (3)
Impact of Gate Control on the Switching Performance of a 750A/3300V Dual SiC-Module
2018
EPE | European Conference on Power Electronics and Applications
N. Soltau
Eugen Wiesner
R. Tsuda
Kenji Hatori
H. Uemura
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Citations (2)
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