Old Web
English
Sign In
Acemap
>
authorDetail
>
J. B. Johnson
J. B. Johnson
IBM
Engineering
Electronic engineering
Electronic component
Anode
Varicap
2
Papers
12
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (2)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications
2015
IRPS | International Reliability Physics Symposium
Chandrasekharan Kothandaraman
X. Chen
Dan Moy
D. Lea
Sami Rosenblatt
Faraz Khan
Derek H. Leu
Toshiaki Kirihata
Dimitris P. Ioannou
G. LaRosa
J. B. Johnson
Norman Robson
Subramanian S. Iyer
Show All
Source
Cite
Save
Citations (11)
A capacitance reliability degradation mechanism in Hyper-abrupt junction varactors
2008
IRPS | International Reliability Physics Symposium
Wagdi W. Abadeer
Richard J. Rassel
J. B. Johnson
Show All
Source
Cite
Save
Citations (1)
1