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K. Isobe
K. Isobe
Toshiba
Physics
Astronomy
Galaxy
Electronic engineering
Optoelectronics
5
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31
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Scalability of strained silicon CMOSFET and high drive current enhancement in the 40 nm gate length technology
2003
IEDM | International Electron Devices Meeting
T. Sanuki
A. Oishi
Y. Morimasa
S. Aota
T. Kinoshita
Ryoji Hasumi
Y. Takegawa
K. Isobe
H. Yoshimura
M. Iwai
Kazumasa Sunouchi
T. Noguchi
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Citations (28)
Cu contamination induced degradation mechanism of embedded flash cell
2001
IEDM | International Electron Devices Meeting
K. Isobe
M. Kanda
T. Murakami
K. Totsuka
M. Moriuchi
T. Miyoshi
Seiji Yamada
T. Noguchi
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ASCA Observation of Groups of Galaxies
1998
Yuzuru Tawara
S. Sato
Akihiro Furuzawa
K. Yamashita
K. Isobe
Yasuki Kumai
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ASCA Measurements of Metal Abundances in Compact Groups of Galaxies
1997
K. Isobe
Yuzuru Tawara
Koujun Yamashita
Hideyo Kunieda
Myrna E. Watanabe
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Metal Poor Halo of Early Type Galaxy NGC 3923
1997
Satoshi B. Sato
Yuzuru Tawara
K. Isobe
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