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K. Das
K. Das
IBM
Metal gate
High-κ dielectric
Logic gate
Inverter
CMOS
2
Papers
13
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0
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A robust reliability methodology for accurately predicting Bias Temperature Instability induced circuit performance degradation in HKMG CMOS
2011
IRPS | International Reliability Physics Symposium
Dimitris P. Ioannou
Kai Zhao
Aditya Bansal
Barry P. Linder
Ronald J. Bolam
E. Cartier
Jae-Joon Kim
Rahul M. Rao
G. La Rosa
G. Massey
Michael J. Hauser
K. Das
James H. Stathis
John M. Aitken
Dinesh Arvindlal Badami
Steven W. Mittl
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Session details: High performance VLSI design
2006
GLSVLSI | Great Lakes Symposium on VLSI
K. Das
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