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Charles L. Chu

Stanford University

6

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Power Struggles: When and Why the Benefits of Power for Individuals Paradoxically Harm Groups

2019 Current opinion in psychology
- Lindred L. Greer
- Charles L. Chu
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Measurement of lateral dopant diffusion in thin silicide layers

1992 IEEE Transactions on Electron Devices
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Gate CMOS due to Lateral Dopant Diffusion in Silicide/Poly silicon Layers

1991
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Technology limitations for N/sup +//P/sup +/ polycide gate CMOS due to lateral dopant diffusion in silicide/polysilicon layers

1991 IEEE Electron Device Letters
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Technology limitations for N+/P+ polycide gate CMOS due to lateral dopant diffusion in silicide/poly

1991 IEEE Electron Device Letters
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Characterization of lateral dopant diffusion in silicides

1990 IEDM | International Electron Devices Meeting
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