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J. M. Trujillo-Sevilla

University of La Laguna

37

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64

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New metrology technique for measuring wafer geometry on a full 300mm silicon wafer

2021
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The optics of the human eye at 8.6 μm lateral resolution

2021 medRxiv
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Stria measurement using wave front phase imaging on an artificial plate

2021
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The optics of the human eye at 8.6 µm resolution.

2021 Scientific Reports
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Roughness and nanotopography measurement of a Silicon Wafer using Wave Front Phase Imaging : High speed single image snapshot of entire wafer producing sub nm topography data

2020 ASMC | Advanced Semiconductor Manufacturing Conference
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Reconstructing wavefront phase from measurements of its slope, an adaptive neural network based approach

2020 Optics and Lasers in Engineering
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High Speed Wafer Geometry on Silicon Wafers Using Wave Front Phase Imaging for Inline Metrology

2020 CSTIC | China Semiconductor Technology International Conference
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Roughness and nanotopography measurement of a Silicon Wafer using Wave Front Phase Imaging : High speed single image snapshot of entire wafer producing sub nm topography data

2020
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Global piston restoration of segmented mirrors withrecurrent neural networks

2020
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Influence of angle Kappa on the optimal intraocular orientation of asymmetric multifocal intraocular lenses.

2020 Journal of Optometry
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