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Lars Knoll
Lars Knoll
Forschungszentrum Jülich
Materials science
Optoelectronics
Surge
Safe operating area
Silicon carbide
4
Papers
3
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0
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An Active Deep Learning Method for the Detection of Defects in Power Semiconductors
2021
ASMC | Advanced Semiconductor Manufacturing Conference
Marco Bellini
Georges Pantalos
Peter Kaspar
Lars Knoll
Luca De Michielis
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Surge current capability of 6.5kV-rated SiC MOSFETs
2020
ISPSD | International Symposium on Power Semiconductor Devices and IC's
A. Mihaila
C. Liu
G. Romano
E Bianda
Stephan Wirths
Y. Arango
Lars Knoll
A. Baschnagel
B. Boksteen
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Vertical Power SiC MOSFETs with High-k Gate Dielectrics and Superior Threshold Voltage Stability
2020
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Stephan Wirths
Y. Arango
Andrei Mihaila
Marco Bellini
G. Romano
Giovanni Alfieri
Manuel Belanche
Lars Knoll
Enea Bianda
Elena Mengotti
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6.5kV Silicon Carbide MOSFETs with 5kV RB safe operating area and MOS-channel surge capability
2020
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Y. Arango
G. Romano
A. Mihaila
Marco Bellini
C. Liu
P. Steimer
Stephan Wirths
Lars Knoll
E Bianda
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