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J. Krick
J. Krick
Texas Instruments
Electronic engineering
Transistor
CMOS
Phase noise
Oscillator phase noise
2
Papers
28
Citations
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An extensive and improved circuit simulation methodology for NBTI recovery
2010
IRPS | International Reliability Physics Symposium
Haldun Kufluoglu
Vijay Reddy
Andrew Marshall
J. Krick
T. Ragheb
Claude R. Cirba
Anand T. Krishnan
Cathy A. Chancellor
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Citations (18)
Impact of transistor reliability on RF oscillator phase noise degradation
2009
IEDM | International Electron Devices Meeting
Vijay Reddy
N. Barton
Samuel Martin
Chih-Ming Hung
Anand T. Krishnan
Cathy A. Chancellor
S. Sundar
Alwin J. Tsao
D. Corum
N. Yanduru
S. Madhavi
Siraj Akhtar
N. Pathak
P. Srinivasan
S. Shichijo
Kamel Benaissa
A. Roy
Tathagata Chatterjee
Richard Taylor
J. Krick
J. Brighton
Jay Ondrusek
D. Barry
Srikanth Krishnan
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Citations (10)
1