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An-Nien Cheng
An-Nien Cheng
Agilent Technologies
Oxide
Failure mode and effects analysis
Optoelectronics
Semiconductor
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2
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20
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Reliability and failure mechanisms of oxide VCSELs in non-hermetic enviroments
2003
Suning Xie
Robert W. Herrick
Gregory N. De Brabander
Wilson H. Cupertino Widjaja
Uli Koelle
An-Nien Cheng
Laura M. Giovane
Frank Z.-Y. San Jose Hu
Mark R. Keever
Tim Osentowski
Scott A. McHugo
Myrna S. Mayonte
Seongsin M. Kim
Danielle R. Chamberlin
S. Jeffrey Rosner
G. Girolami
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Citations (13)
Reliability of oxide VCSELs in non-hermetic environments
2002
LEOS | Lasers and Electro-Optics Society Meeting
Suning Xie
G. De Brabander
Wilson H. Cupertino Widjaja
U. Koelle
An-Nien Cheng
L. Giovane
Frank Z.-Y. San Jose Hu
Robert W. Herrick
Mark R. Keever
Tim Osentowski
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Citations (7)
1