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W. S. Park
W. S. Park
Samsung
Microstructure
Stress (mechanics)
Electromigration
Oxide
Focused ion beam
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Enhancement of electromigration lifetime of aluminum interconnection line by stress accommodation of interfaced oxide
1998
T.J. Lee
H.J. Park
C. S. Song
S.J. Kim
W. S. Park
N. Y. Kim
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