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Russel Gwilliam
Russel Gwilliam
University of Surrey
Analytical chemistry
Mixed layer
Thin film
Secondary ion mass spectrometry
Thin layers
2
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3
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0
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X-ray induced Sm-ion valence conversion in Sm-ion implanted fluoroaluminate glasses towards high-dose radiation measurement
2019
Journal of Materials Science: Materials in Electronics
Farley Chicilo
Cyril Koughia
Richard J. Curry
Russel Gwilliam
Ruben Ahumada-Lazo
A. Edgar
David J. Binks
Dean Chapman
S. O. Kasap
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Citations (3)
SIMS characterization of thin layers of IR and its silicides
1996
Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms
JoséM. Blanco
JoséJ. Serrano
J. Jiménez-Leube
T. Rodríguez
M. Aguilar
Russel Gwilliam
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