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Min Han Mi
Min Han Mi
Xidian University
Logic gate
Engineering
Breakdown voltage
Aluminum gallium nitride
Leakage (electronics)
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18
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Analysis of the Breakdown Characterization Method in GaN-Based HEMTs
2016
IEEE Transactions on Power Electronics
Sheng-Lei Zhao
Bin Hou
Wei-Wei Chen
Min Han Mi
Jia Xin Zheng
Jin-cheng Zhang
Xiao Hua Ma
Yue Hao
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