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S. Lengweiler
S. Lengweiler
Carl Zeiss AG
Contrast transfer function
Conventional transmission electron microscope
Scanning transmission electron microscopy
Environmental scanning electron microscope
Microscope
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3
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Phase Contrast Aberration Corrected Electron Microscope for Phase Plate Imaging
2010
Microscopy and Microanalysis
E. Majorovits
B Barton
Gerd Benner
C Dietl
Werner Kühlbrandt
S. Lengweiler
Thilo Mandler
Marko Matijevic
H. Niebel
Rasmus R. Schröder
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Citations (3)
Electron optical design of the Phase Aberration Corrected Electron Microscope
2008
Marko Matijevic
S. Lengweiler
Dirk Preikszas
H. Müller
Rasmus R. Schröder
Gerd Benner
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