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Ronald G. Filippi
Ronald G. Filippi
GlobalFoundries
Engineering
Electronic engineering
Time-dependent gate oxide breakdown
Copper interconnect
Reliability engineering
2
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9
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0
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Effect of metal line width on electromigration of BEOL Cu interconnects
2018
IRPS | International Reliability Physics Symposium
Seungman Choi
Cathryn Christiansen
Linjun Cao
James Zhang
Ronald G. Filippi
Tian Shen
Kong Boon Yeap
Sean Ogden
Haojun Zhang
Bianzhu Fu
Patrick Justison
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Correlation between the variation in the initial current at stress and the variation in the failure time during TDDB testing of BEOL structures
2016
IRPS | International Reliability Physics Symposium
Ronald G. Filippi
Cathryn Christiansen
Ping-Chuan Wang
A. T. Kim
B. Li
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