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Lira Hwang
Lira Hwang
Samsung
Electronic engineering
High-κ dielectric
MOSFET
Engineering
Inverter
4
Papers
31
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Reliability characterizations of display driver IC on High-k/ metal-gate technology
2016
IRPS | International Reliability Physics Symposium
Dong-Hoon Kim
Jungdong Kim
Kidan Bae
Hye-jin Kim
Lira Hwang
Sang-chul Shin
Hyung-Nyung Park
Intaek Ku
Jongwoo Park
Sangwoo Pae
Haebum Lee
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Citations (1)
Experimental study on BTI variation impacts in SRAM based on high-k/metal gate FinFET: From transistor level Vth mismatch, cell level SNM to product level Vmin
2015
IEDM | International Electron Devices Meeting
Changze Liu
Hyeonwoo Nam
Kangjung Kim
Seungjin Choo
Hye-jin Kim
Hyun-Jin Kim
Yoohwan Kim
Soonyoung Lee
Sungyoung Yoon
Jungin Kim
Jin Ju Kim
Lira Hwang
Sungmock Ha
Minjung Jin
Hyun Chul Sagong
Junekyun Park
Sangwoo Pae
Jongwoo Park
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Citations (7)
Frequency dependent TDDB behaviors and its reliability qualification in 32nm high-k/metal gate CMOSFETs
2011
IRPS | International Reliability Physics Symposium
Kyong Taek Lee
Jongik Nam
Minjung Jin
Kidan Bae
Junekyun Park
Lira Hwang
Jungin Kim
Hyun-Jin Kim
Jongwoo Park
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Citations (21)
Behaviors and physical degradation of HfSiON MOSFET linked to strained CESL performance booster
2011
IRPS | International Reliability Physics Symposium
Kidan Bae
Minjung Jin
Ha Jin Lim
Lira Hwang
Dongseok Shin
Junekyun Park
Jinchul Heo
Jong-ho Lee
Jinho Do
Ilchan Bae
Chulhee Jeon
Jongwoo Park
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Citations (2)
1