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Balaji Jayaraman
Balaji Jayaraman
IBM
Metal gate
Electronic engineering
eDRAM
Optoelectronics
Sheet resistance
3
Papers
12
Citations
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Modeling and Characterization of Gate Leakage in High-K Metal Gate Technology-Based Embedded DRAM
2013
IEEE Transactions on Electron Devices
Mohit Bajaj
Rajan K. Pandey
Sandip De
Ninad D. Sathaye
Balaji Jayaraman
Rishikesh Krishnan
Puneet Goyal
Stephen S. Furkay
Edward J. Nowak
Subramanian S. Iyer
Kota V. R. M. Murali
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Citations (5)
Performance analysis and modeling of deep trench decoupling capacitor for 32 nm high-performance SOI processors and beyond
2012
ICICDT | International Conference on IC Design and Technology
Balaji Jayaraman
Sneha Gupta
Yanli Zhang
Puneet Goyal
Herbert L. Ho
Rishikesh Krishnan
Sunfei Fang
Sungjae Lee
Douglas Daley
Kevin McStay
Bernhard Wunder
John E. Barth
Sadanand V. Deshpande
Paul C. Parries
Rajeev Malik
P. Agnello
Scott R. Stiffler
Subramanian S. Iyer
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Citations (7)
Characterization of silicide-silicon interface contact resistivity using 1-D dual transmission line model approximation of modified cross bridge kelvin measurements
2012
PSD | International Workshop on Physics of Semiconductor Devices
Ankr Arya
Balaji Jayaraman
Mohit Bajaj
A. Dixit
Cung D. Tran
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