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W. Tonti
W. Tonti
Electronic engineering
CMOS
Electrical engineering
Reliability engineering
Computer science
4
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4
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RF Modeling of 45nm Low-Power CMOS Technology
2009
U. Gogineni
R Groves
Basanth Jagannathan
Hongmei Li
M H Na
Li-hong Pan
W. Tonti
Richard A. Wachnik
Jing Wang
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CMOS and interconnect reliability process and electrical degradation in flash memories and performance boosted CMOS devices
2005
IEDM | International Electron Devices Meeting
A. Visconti
W. Tonti
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Developing aged SPICE model for hot carrier reliability simulation
2000
IIRW | International Integrated Reliability Workshop
Qiuyi Ye
H. Terletzki
W. Tonti
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Signal margin test to identify process sensitivities relevant to DRAM reliability and functionality at low temperatures
1999
IIRW | International Integrated Reliability Workshop
E. Nelson
Yujun Li
D. Poindexter
M. Ruprecht
E. Lim
Y. Matsubara
H. Sawazaki
Qiuyi Ye
M. Iwatake
W. Tonti
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