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Mitsuhiro Hamada
Mitsuhiro Hamada
Mitsubishi Electric
Computer science
Electronic engineering
Dram
Computer hardware
Embedded system
6
Papers
173
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A built-in self-repair analyzer (CRESTA) for embedded DRAMs
2000
ITC | International Test Conference
Tomoya Kawagoe
Jun Ohtani
Mitsutaka Niiro
Tukasa Ooishi
Mitsuhiro Hamada
Hideto Hidaka
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Citations (154)
A built-in self-test circuit with timing margin test function in a 1 Gbit synchronous DRAM
1996
ITC | International Test Conference
Narumi Sakashita
Fumihiro Okuda
K. Shimomura
Hiroki Shimano
Mitsuhiro Hamada
Tetsuo Tada
Shinji Komori
Kazuo Kyuma
Akihiko Yasuoka
Haruhiko Abe
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Citations (17)
Structure of the test program for vlsi memory devices and its application
1992
Electronics and Communications in Japan Part Ii-electronics
Mitsuhiro Hamada
Yasumasa Nishimura
Tetsuo Tada
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An address access time measurement method for high‐speed mos static rams
1991
Electronics and Communications in Japan Part Ii-electronics
Yasumasa Nishimura
Mitsutaka Niiro
Koji Tanaka
Mitsuhiro Hamada
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Redundancy Test for 1 Mbit DRAM Using Multi-Bit-Test Mode.
1986
ITC | International Test Conference
Yasumasa Nishimura
Mitsuhiro Hamada
Hideto Hidaka
Hideyuki Ozaki
Kazuyasu Fujishima
Y. Hayasaka
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Citations (2)
A new timing calibration method for high speed memory test
1984
ITC | International Test Conference
Yasumasa Nishimura
Mitsuhiro Hamada
Y. Hayasaka
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