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Temel Buyuklimanli
Temel Buyuklimanli
Analytical chemistry
Thin film
Inorganic chemistry
Dopant
Wafer
5
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39
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Accurate CIGS composition measurements using surface analytical techniques
2011
PVSC | Photovoltaic Specialists Conference
Gary Mount
John Moskito
Udit Sharma
Greg Strossman
Larry Wang
Patrick Schnabel
Temel Buyuklimanli
Karol Putyera
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Investigation of differences between high and low efficiency CIGS solar cell structures using surface analytical techniques
2010
PVSC | Photovoltaic Specialists Conference
Gary Mount
Temel Buyuklimanli
Roger (Michel)
John Moskito
Steve Robie
Udit Sharma
Larry Wang
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Plasma implanted ultra shallow junction boron depth profiles: Effect of plasma chemistry and sheath conditions
2006
Journal of Vacuum Science & Technology B
Steve Walther
Ludovic Godet
Temel Buyuklimanli
John Weeman
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Clustering Analysis in Boron and Phosphorus Implanted (100) Germanium by X-Ray Absorption Spectroscopy
2005
MRS Proceedings
M. Alper Sahiner
P. H. Ansari
Malcolm S. Carroll
C. A. King
Y. S. Suh
Roland A. Levy
Temel Buyuklimanli
Mark Croft
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Citations (3)
Phosphorus Doping and Sharp Profiles in Silicon and Silicon‐Germanium Epitaxy by Rapid Thermal Chemical Vapor Deposition
2000
Journal of The Electrochemical Society
Min Yang
Malcolm S. Carroll
James C. Sturm
Temel Buyuklimanli
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Citations (28)
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