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S. Hoffer
S. Hoffer
Sandia National Laboratories
Resolution (mass spectrometry)
Ion cyclotron resonance
Ion beam
Secondary ion mass spectrometry
Reflectron
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High mass resolution SIMS
2004
Applied Surface Science
Sean P. Maharrey
R. Bastasz
Richard Behrens
Aaron M. Highley
S. Hoffer
G. Kruppa
J. Whaley
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Citations (15)
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