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Y.C. Tan
Y.C. Tan
Chartered Semiconductor Manufacturing
CMOS
Time-dependent gate oxide breakdown
Electronic engineering
Engineering
Capacitor
2
Papers
35
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Critical ultra low-k TDDB reliability issues for advanced CMOS technologies
2009
IRPS | International Reliability Physics Symposium
Fen Chen
M. Shinosky
B. Li
J. Gambino
S. Mongeon
P. Pokrinchak
John M. Aitken
Dinesh Arvindlal Badami
Matthew Angyal
Ravi Achanta
Griselda Bonilla
G. Yang
P. Liu
K. Li
J. Sudijono
Y.C. Tan
T.J. Tang
C. Child
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Citations (22)
TDDB robustness of highly dense 65NM BEOL vertical natural capacitor with competitive area capacitance for RF and mixed-signal applications
2008
IRPS | International Reliability Physics Symposium
Armin Fischer
Y.K. Lim
Ph. Riess
Th. Pompl
Bei Chao Zhang
E-C Chua
W.W. Keller
J.B. Tan
V. Klee
Y.C. Tan
D. Souche
Dong Kyun Sohn
A. von Glasow
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Citations (13)
1