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Peter de Jong
Peter de Jong
NXP Semiconductors
Electronic engineering
Engineering
Electrostatic discharge
Robustness (computer science)
Breakdown voltage
2
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4
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ESD protection for thin gate oxides in 65 nm
2010
Microelectronics Reliability
Guido Notermans
Theo Smedes
Željko Mrčarica
Peter de Jong
Ralph Stephan
Hans van Zwol
Dejan Maksimovic
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Citations (4)
ESD robust high-voltage active clamps
2009
Microelectronics Reliability
Guido Notermans
O. Quittard
Anco Heringa
Željko Mrčarica
Fabrice Blanc
Hans van Zwol
Theo Smedes
Thomas Keller
Peter de Jong
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