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D. J. Roth
D. J. Roth
Technion – Israel Institute of Technology
Raman spectroscopy
Microstructure
Laser
Heterojunction
Ranging
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Thickness measurements of Si1−xGex layers on Si mesa structures using Raman spectroscopy
1996
Applied Physics Letters
A. Wasserman
D. J. Roth
R. Beserman
A. Hoffman
K. Dettmer
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