Edward White
- National Institute of Standards and Technology
46
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867
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0.04
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- 2012 Metrologia
- Steven Westwood
- Ralf D. Josephs
- Adeline Daireaux
- Robert Wielgosz
- Stephen Davies
- Hongjie Wang
- Jainana Rodrigues
- Wagner Wollinger
- Anthony Windust
- Ma Kang
- Su Fuhai
- Rosemarie Philipp
- Paul Kuhlich
- Siu-kay Wong
- Yoshitaka Shimizu
- Melina Pérez
- Marco Avila
- Maria Fernandes-Whaley
- D Prevoo
- J. de Vos
- Ria Visser
- Marcellé Archer
- Thierry LeGoff
- Steve Wood
- Dan Bearden
- Mary Bedner
- Arezue F. B. Boroujerdi
- David L. Duewer
- Diane K. Hancock
- Brian E. Lang
- Barbara J. Porter
- Michele M. Schantz
- John R. Sieber
- Edward White
- Stephen A. Wise
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