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O. Crépel
O. Crépel
Materials science
Optoelectronics
Degradation (geology)
Silicon carbide
Power MOSFET
2
Papers
1
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0
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Backside Laser Testing of Single-Event Effects in GaN-on-Si Power HEMTs
2021
IEEE Transactions on Nuclear Science
C. Ngom
Vincent Pouget
M. Zerarka
F. Coccetti
A. D. Touboul
M. Matmat
O. Crépel
S. Jonathas
G. Bascoul
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Silicon carbide power MOSFETs under neutron irradiation: Failure In Time demonstration and long term reliability degradation evaluation
2019
K. Niskanen
Antoine Touboul
R. Coq Germanicus
A. Michez
Frédéric Wrobel
Jérôme Boch
V. Pouget
P. Gironés
S. Morand
O. Crépel
Cecile Weulersse
C. Binois
Frédéric Saigné
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