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A. Łaszcz
A. Łaszcz
Université catholique de Louvain
Annealing (metallurgy)
Silicide
Analytical chemistry
High-resolution transmission electron microscopy
Materials science
5
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10
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Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers
2010
Journal of Microscopy
A. Łaszcz
A. Czerwiński
J. Ratajczak
Anna Szerling
F. Phillipp
P. A. van Aken
J. Katcki
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Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications
2010
Journal of Microscopy
J. Ratajczak
A. Łaszcz
A. Czerwinski
J. Katcki
F. Phillipp
P. A. van Aken
Nicolas Reckinger
E. Dupois
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Characterization of ytterbium silicide formed in ultra high vacuum
2010
A. Łaszcz
J. Ratajczak
A. Czerwinski
J. Katcki
Vesna Srot
F. Phillipp
P. A. van Aken
D. Yarekha
Nicolas Reckinger
G. Larrieu
E. Dubois
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HRTEM characterization of erbium silicide formed in ultra-high vacuum
2009
A. Łaszcz
J. Ratajczak
A. Czerwinski
J. Katcki
F. Phillipp
P. A. van Aken
D. Yarekha
Nicolas Reckinger
G. Larrieu
E. Dubois
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Transmission electron microscopy of iridium silicide contacts for advanced MOSFET structures with Schottky source and drain
2004
Journal of Alloys and Compounds
A. Łaszcz
J. Kątcki
Jacek Ratajczak
G. Larrieu
E. Dubois
X. Wallart
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Citations (2)
1