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M. Rzin
M. Rzin
University of Padua
Optoelectronics
Engineering
Electronic engineering
Voltage
Electric field
5
Papers
15
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Reliability comparison of AlGaN/GaN HEMTs with different carbon doping concentration
2019
Microelectronics Reliability
Z. Gao
Matteo Meneghini
Fabiana Rampazzo
M. Rzin
C. De Santi
Gaudenzio Meneghesso
Enrico Zanoni
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Citations (2)
Linearity and robustness evaluation of 150-nm AlN/GaN HEMTs
2019
Microelectronics Reliability
M. Rzin
Matteo Meneghini
Fabiana Rampazzo
V. Gao Zhan
C. De Santi
Riad Kabouche
Malek Zegaoui
Farid Medjdoub
Gaudenzio Meneghesso
Enrico Zanoni
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Investigation into trapping modes and threshold instabilities of state-of-art commercial GaN HEMTs
2019
Microelectronics Reliability
Kalparupa Mukherjee
C. De Santi
M. Rzin
Z. Gao
Gaudenzio Meneghesso
Matteo Meneghini
Enrico Zanoni
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Citations (2)
Reliability comparison of AlGaN/GaN HEMTs with different carbon doping concentration
2019
Microelectronics Reliability
Z. Gao
Matteo Meneghini
Fabiana Rampazzo
M. Rzin
C. De Santi
Gaudenzio Meneghesso
Enrico Zanoni
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Citations (4)
On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs
2018
Microelectronics Reliability
M. Rzin
Alessandro Chini
C. De Santi
Matteo Meneghini
A. Hugger
M. Hollmer
H. Stieglauer
M Madel
J. Splettstober
D. Sommer
Jan Grünenpütt
K. Beilenhoff
H. Blanck
J. T. Chen
O. Kordina
Gaudenzio Meneghesso
Enrico Zanoni
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Citations (2)
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