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T. Kemmer
T. Kemmer
Fraunhofer Society
Optoelectronics
Charge density
Electronic engineering
Engineering
Switching time
2
Papers
6
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0
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Deep Submicron III-N HEMTs – Technological Development and Reliability
2019
IEDM | International Electron Devices Meeting
Ruediger Quay
Michael Dammann
T. Kemmer
Peter Brückner
Maciej Cwiklinski
Dirk Schwantuschke
Sebastian Krause
Stefano Leone
Michael Mikulla
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Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology
2018
Microelectronics Reliability
M. Dammann
M. Baeumler
Peter Brückner
T. Kemmer
H. Konstanzer
Andreas Graff
Michél Simon-Najasek
R. Quay
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