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David Petru
David Petru
Sheet resistance
Annealing (metallurgy)
Silicide
Electronic engineering
Integrated circuit
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Differential silicide thickness for ULSI scaling
2003
William J. Taylor
J. Smith
Jen-Yee Nguyen
Raghaw Rai
Olubunmi Adetutu
James Geren
Juan Ybarra
David Petru
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