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J. Badoc
J. Badoc
STMicroelectronics
Engineering
Electronic engineering
Safe operating area
CMOS
Compromise
1
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12
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Hot-carrier reliability of 20V MOS transistors in 0.13 μm CMOS technology
2005
Microelectronics Reliability
Yannick Rey-Tauriac
J. Badoc
B. Reynard
R.A. Bianchi
D. Lachenal
Alain Bravaix
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Citations (12)
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