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Boris Baldischweiler
Boris Baldischweiler
Fraunhofer Society
Electronic engineering
Noise temperature
Mathematics
Transistor
Noise measurement
4
Papers
26
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On the determination of noise parameters of low‐noise transistor devices
2015
International Journal of Numerical Modelling-electronic Networks Devices and Fields
M. Seelmann-Eggebert
B. Aja
Boris Baldischweiler
Giuseppe Moschetti
H. Massler
Daniel Bruch
M. Schlechtweg
O. Ambacher
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Figures of uncertainty for noise measurements
2013
ARFTG | ARFTG Microwave Measurement Conference
M. Seelmann-Eggebert
Boris Baldischweiler
B. Aja
Daniel Bruch
H. Massler
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Characterization of a DC to 40 GHz SPDT switch based on GaAs mHEMT technology at cryogenic temperature
2013
EMICC | European Microwave Integrated Circuit Conference
Boris Baldischweiler
Daniel Bruch
Ingmar Kallfass
M. Seelmann-Eggebert
A. Leuther
Detlef Peschel
M. Schlechtweg
O. Ambacher
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4–12- and 25–34-GHz Cryogenic mHEMT MMIC Low-Noise Amplifiers
2012
IEEE Transactions on Microwave Theory and Techniques
Beatriz Aja Abelán
M. Seelmann-Eggebert
Daniel Bruch
A. Leuther
H. Massler
Boris Baldischweiler
M. Schlechtweg
Juan Daniel Gallego-Puyol
Isaac Lopez-Fernandez
Carmen Diez-Gonzalez
Inmaculada Malo-Gomez
E. Villa
E. Artal
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Citations (24)
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