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Yanyan Wang

Tianjin University of Technology and Education

3

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16

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Axial displacement measurement with high resolution of particle movement based on compound digital holographic microscopy

2020 Optics Communications
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A new precise positioning method for piezoelectric scanner of AFM

2019 Ultramicroscopy
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An intelligent control scheme for precise tip-motion control in atomic force microscopy.

2016 Scanning
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