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Thomas R. Albrecht
Thomas R. Albrecht
AmeriCorps VISTA
Nanocellulose
Optics
Optical microscope
Raman spectroscopy
Analytical chemistry
2
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34
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The Influence of Additives on the Interfacial Width and Line Edge Roughness in Block Copolymer Lithography
2020
Chemistry of Materials
Daniel F. Sunday
Xuanxuan Chen
Thomas R. Albrecht
Derek Nowak
Paulina Rincon Delgadillo
Takahiro Dazai
Ken Miyagi
Takaya Maehashi
Akiyoshi Yamazaki
Paul F. Nealey
R. Joseph Kline
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Citations (10)
Photoinduced force microscopy: A technique for hyperspectral nanochemical mapping
2017
Japanese Journal of Applied Physics
Ryan A. Murdick
William Morrison
Derek Nowak
Thomas R. Albrecht
Junghoon Jahng
Sung Park
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Citations (24)
1