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Tianhao Zhang
Tianhao Zhang
State University of New York System
Materials science
Analytical chemistry
Optoelectronics
Ellipsometry
Spectroscopy
3
Papers
9
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Spectroscopic Ellipsometry of CVD Graphene
2011
Florence Nelson
Vimal Kumar Kamineni
Tianhao Zhang
Everett Comfort
Ji Ung Lee
Alain C. Diebold
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Citations (7)
Spectroscopic Ellipsometry Characterization of High‐k films on SiO2/Si
2009
Ming Di
Eric Bersch
Steven Consiglio
Tianhao Zhang
Parul Tyagi
Robert D. Clark
Gert Leusink
Arun R. Srivatsa
Alain C. Diebold
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Photoreflectance Spectroscopic Characterization of Si with SiO2 and HfO2 Dielectric Layers
2009
Tianhao Zhang
Ming Di
Eric Bersch
Houssam Chouaib
Alex Salnik
Lena Nicolaides
Chris Bevis
Steven Consiglio
Robert D. Clark
Alain C. Diebold
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Citations (2)
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