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I. Tsameret
I. Tsameret
Intel
Electronic engineering
System on a chip
Materials science
Microprocessor
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3
Papers
27
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Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests
2021
IRPS | International Reliability Physics Symposium
P. Xiao
H. Hadziosmanovic
M. Klessens
R. Jiang
John Ortega
D. Schroeder
J. Palmer
I. Tsameret
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Reliability of dual-damascene local interconnects featuring cobalt on 10 nm logic technology
2018
IRPS | International Reliability Physics Symposium
F. Griggio
J. Palmer
F. Pan
N. Toledo
Anthony Schmitz
I. Tsameret
Rahim Kasim
Gerald S. Leatherman
J. Hicks
A. Madhavan
J. Shin
Joseph M. Steigerwald
Andrew W. Yeoh
C. Auth
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Performance enhancement for 14nm high volume manufacturing microprocessor and system on a chip processes
2016
IITC | International Interconnect Technology Conference
Kevin J. Fischer
H.K Chang
D. Ingerly
I. Jin
H. Kilambi
J. Longun
R. Patel
C. Pelto
C. Petersburg
P. Plekhanov
C. Puls
L. Rockford
I. Tsameret
M. Uncuer
P. Yashar
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Citations (10)
1