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Satoshi Ohno
Satoshi Ohno
Ehime University
Logic gate
Computer science
Real-time computing
Stuck-at fault
Fault coverage
2
Papers
26
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Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool
2012
IEICE Transactions on Information and Systems
Yoshinobu Higami
Satoshi Ohno
Hironori Yamaoka
Hiroshi Takahashi
Yoshihiro Shimizu
Takashi Aikyo
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Diagnostic test generation for transition faults using a stuck-at ATPG tool
2009
ITC | International Test Conference
Yoshinobu Higami
Yosuke Kurose
Satoshi Ohno
Hironori Yamaoka
Hiroshi Takahashi
Yoshihiro Shimizu
Takashi Aikyo
Yuzo Takamatsu
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Citations (25)
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