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Qingxuan Li
Qingxuan Li
Guangxi University
Analytical chemistry
Ellipsometry
Thin film
Materials science
Chemical vapor deposition
5
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12
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Investigation of the Optical Properties of InSb Thin Films Grown on GaAs by Temperature-Dependent Spectroscopic Ellipsometry
2019
Journal of Applied Spectroscopy
Yuanlan Liang
Fangze Wang
Xuguang Luo
Qingxuan Li
Tao Lin
Ian T. Ferguson
Qingyi Yang
Lingyu Wan
Zhe Chuan Feng
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Surface and optical properties of indium-rich InGaN layers grown on sapphire by migration-enhanced plasma assisted metal organic chemical vapor deposition
2018
Chi Zhang
Yao Li
Yingda Qian
Yuanlan Liang
D. N. Talwar
Shih-Yung Huang
Qingxuan Li
Daniel Seidlitz
Nikolaus Dietz
Dong-Sing Wuu
Ian T. Ferguson
Xiang Lu
Lingyu Wan
Kaiyan He
Zhe Chuan Feng
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Citations (3)
Variation of phonon coupling factors in the photoluminescence of cadmium telluride by variable excitation power
2017
Optical Materials Express
Zhe Chuan Feng
Qingxuan Li
Lingyu Wan
Gu Xu
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Spectroscopic ellipsometry studies on ZnCdO thin films with different Cd concentrations grown by pulsed laser deposition
2017
Applied Surface Science
Shuai Chen
Qingxuan Li
Ian T. Ferguson
Tao Lin
Lingyu Wan
Zhe Chuan Feng
Liping Zhu
Zhizhen Ye
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Citations (6)
GaN Films under Different Growth Mechanisms Studied by Synchrotron X-ray Absorption Spectroscopy
2016
Qingxuan Li
Yu-Jia Liu
Yao Liu
Yi Liang
Hao-Hsiung Lin
Jyh-Fu Lee
Na Lu
Ian T. Ferguson
Lingyu Wan
Zhe Chuang Feng
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