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Allan Dobbin
Allan Dobbin
Freescale Semiconductor
Electrical engineering
Electronic engineering
Engineering
Electrostatic discharge
NMOS logic
2
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19
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Investigation of product burn-in failures due to powered NPN bipolar latching of active MOSFET rail clamps
2013
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Scott Ruth
James W. Miller
Alex Gerdemann
Michael Stockinger
Melanie Etherton
M. Moosa
Allan Dobbin
Robert Mertens
Kuo Hsuan Meng
Elyse Rosenbaum
Paolo Colombo
Martina Cordoni
Nicolas Guitard
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When good trigger circuits go bad: A case history
2011
EOS/ESD | Electrical Overstress/Electrostatic Discharge Symposium
Alex Gerdemann
James W. Miller
Michael Stockinger
Norman Herr
Allan Dobbin
Reyhan Ricklefs
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Citations (9)
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