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J. Meyer-Ilse
J. Meyer-Ilse
Lawrence Berkeley National Laboratory
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Optics
Physics
Chemical physics
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5
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38
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Detection of defect populations in superhard semiconductor boron subphosphide B12P2 through X-ray absorption spectroscopy
2017
Journal of Materials Chemistry
S. P. Huber
Eric M. Gullikson
J. Meyer-Ilse
Clint D. Frye
James H. Edgar
R. W. E. van de Kruijs
Frederik Bijkerk
David Prendergast
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Citations (5)
X線吸収分光法による超硬半導体ほう素subphosphide B_12P_2における欠陥集団の検出【Powered by NICT】
2017
Journal of materials chemistry. A, Materials for energy and sustainability
S. P. Huber
Eric M. Gullikson
J. Meyer-Ilse
Clint D. Frye
James H. Edgar
R.W.E. van de Kruijs
F. Bijkerk
David Prendergast
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Exploiting the P L2,3 absorption edge for optics: spectroscopic and structural characterization of cubic boron phosphide thin films
2016
Optical Materials Express
S. P. Huber
Vyacheslav Medvedev
J. Meyer-Ilse
Eric M. Gullikson
Balabalaji Padavala
James H. Edgar
Jacobus Marinus Sturm
R. W. E. van de Kruijs
David Prendergast
Frederik Bijkerk
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Citations (6)
Branched isomeric 1,2,3-triazolium-based ionic liquids: new insight into structure–property relationships
2015
Physical Chemistry Chemical Physics
Michael Lartey
J. Meyer-Ilse
John D. Watkins
Elliot Roth
Sage R. Bowser
Victor A. Kusuma
Krishnan Damodaran
Xu Zhou
Maciej Haranczyk
Erik Albenze
David R. Luebke
David Hopkinson
Jeffrey B. Kortright
Hunaid B. Nulwala
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Citations (14)
Sub-micron focusing of soft x-ray free electron laser beam
2009
Sasa Bajt
Henry N. Chapman
A. J. Nelson
R. W. Lee
S. Toleikis
Paul B. Mirkarimi
Jennifer B. Alameda
Sherry L. Baker
H. Vollmer
R. T. Graff
Andrew Aquila
Eric M. Gullikson
J. Meyer-Ilse
Eberhard Spiller
J. Krzywinski
L. Juha
J. Chalupsky
V. Hájková
Janos Hajdu
T. Tschentscher
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Citations (13)
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