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A. Demesmaeker
A. Demesmaeker
NMOS logic
Safe operating area
Electronic engineering
Limiting
Transistor
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Design rule limitations due to hot carrier degradation of NMOS transistor under DC stress
2000
IIRW | International Integrated Reliability Workshop
D. Regis
C. Dekeukeleire
Wim Vanderbauwhede
A. Demesmaeker
A. Pergoot
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