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Ricardo Olivo
Ricardo Olivo
Fraunhofer Society
Materials science
Flicker noise
Optoelectronics
Ferroelectricity
charge pumping
3
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In-Memory Nearest Neighbor Search with FeFET Multi-Bit Content-Addressable Memories
2021
| Design, Automation & Test in Europe
Arman Kazemi
Mohammad Mehdi Sharifi
Ann Franchesca Laguna
Franz Muller
Ramin Rajaei
Ricardo Olivo
Thomas Kämpfe
Michael Niemier
X. Sharon Hu
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Impact of Channel Implant Variation on RTN and Flicker Noise
2020
EUROSOI-ULIS | Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon
Yannick Raffel
K. Seidel
Luca Pirro
Steffen Lehmann
Raik Hoffmann
Ricardo Olivo
Thomas Kämpfe
Johannes Heitmann
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Charge Pumping and Flicker Noise-based Defect Characterization in Ferroelectric FETs
2020
IIRW | International Integrated Reliability Workshop
Yannick Raffel
Maximilian Lederer
Ricardo Olivo
Franz Muller
R. Hoffmann
T. Ali
Thomas Kämpfe
K. Seidel
Johannes Heitmann
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