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Jeremy D. Ellis
Jeremy D. Ellis
Dielectric
Optics
X band
Scattering
Waveguide
1
Papers
12
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An X-band waveguide measurement technique for the accurate characterization of materials with low dielectric loss permittivity
2016
Review of Scientific Instruments
Kenneth W. Allen
Mark M. Scott
David R. Reid
Jeffrey A. Bean
Jeremy D. Ellis
Andrew P. Morris
Jeramy M. Marsh
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Citations (12)
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