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Y.S. Tam
Y.S. Tam
Analysis Group
Electronic engineering
Materials science
Integrated circuit
Root cause
Foundry
3
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Invisible Defect Identification by Electrical Nanoprobing Analysis
2018
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
P.T. Ng
C. Q. Chen
Y.S. Tam
K.H. Yip
Angela Teo
G.H. Ang
Z. H. Mai
Jeffrey Lam
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Achieving Simplified Biasing Conditions with Pin Reduction Approach to enhance Static Fault Localization Capability
2018
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Sj. Moon
A. C. T. Quah
D. Nagalingam
K.H. Yip
C. Q. Chen
Y.S. Tam
P.T. Ng
Hp. Ng
G. B. Ang
Jeffrey Lam
Z. H. Mai
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Failure Analysis Case Studies on Wafer Edge Failure due to Process Uniformity Issue
2018
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
N. Y. Xu
H. P. Ng
G. B. Ang
C. Q. Chen
Angela Teo
A. Jerome
Y.S. Tam
Y. Li
Z. H. Mai
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