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Michael Cook
Michael Cook
ON Semiconductor
Stress (mechanics)
Transistor
MOSFET
Engineering
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Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors
2021
IRPS | International Reliability Physics Symposium
Konner E. K. Holden
Gavin D. R. Hall
Michael Cook
Chris Kendrick
Kaitlyn Pabst
B. Greenwood
Robin Daugherty
Jeff Gambino
Derryl Allman
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Reliability of NLDMOS transistors subjected to repetitive power pulses
2008
IRPS | International Reliability Physics Symposium
Chris Kendrick
Roger Stout
Michael Cook
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