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Peter Deeb
Peter Deeb
Materials science
Electronic engineering
Parametric statistics
Process capability
Robustness (computer science)
2
Papers
13
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Design of Area-Efficient, Robust and Reliable Junction Termination Extension in SiC Devices
2016
Materials Science Forum
Alexander Viktorovich Bolotnikov
Peter Almern Losee
Peter Deeb
Meng Li Wang
Greg Dunne
J. Kretchmer
Stephen Daley Arthur
Ljubisa Dragoljub Stevanovic
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Citations (9)
High Performance 1.2kV-2.5kV 4H-SiC MOSFETs with Excellent Process Capability and Robustness
2016
Materials Science Forum
Peter Almern Losee
Alexander Viktorovich Bolotnikov
Stacey Kennerly
Christopher Collazo-Davila
David Alan Lilienfeld
Greg Dunne
Thomas Bert Gorczyca
Peter Deeb
J. Kretchmer
David Richard Esler
Ljubisa Dragoljub Stevanovic
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Citations (4)
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