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Carole Graas
Carole Graas
IBM
Electronic engineering
Engineering
Electromigration
Scaling
Dielectric strength
5
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48
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Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges
2015
Microelectronics Reliability
Fen Chen
Carole Graas
Michael A. Shinosky
Kai Zhao
Shreesh Narasimha
Xiao Hu Liu
C. E. Tian
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Citations (13)
Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability
2015
IRPS | International Reliability Physics Symposium
Mukta G. Farooq
G. La Rosa
Fen Chen
Prakash Periasamy
Troy L. Graves-Abe
Chandrasekharan Kothandaraman
Christopher N. Collins
William F. Landers
Jennifer Oakley
Jin Liu
John M. Safran
S. Ghosh
Steven W. Mittl
Dimitris P. Ioannou
Carole Graas
Daniel George Berger
Subramanian S. Iyer
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Diagnostic electromigration reliability evaluation with a local sensing structure
2015
IRPS | International Reliability Physics Symposium
Fen Chen
Erik McCullen
Cathryn Christiansen
Michael A. Shinosky
Roger A. Dufresne
Prakash Periasamy
Rick Kontra
Carole Graas
Gary StOnge
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New breakdown data generation and analytics methodology to address BEOL and mol dielectric TDDB process development and technology qualification challenges
2014
IRPS | International Reliability Physics Symposium
Fen Chen
Carole Graas
Michael A. Shinosky
Chuck Griffin
Roger A. Dufresne
Ronald J. Bolam
Cathryn Christiansen
Kai Zhao
Shreesh Narasimha
C. E. Tian
Choon-Leong Lou
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Citations (27)
Embedded powerPC 405 & 440-based SoC product qualifications on 45°-rotated substrates
2009
IRPS | International Reliability Physics Symposium
Pascal A. Nsame
George Tang
Ernie Viau
Khambay Outama
Teddy Nigussie
Claude Dunston
Edward Sziklas
George Goth
Carole Graas
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