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H. W. Nam
H. W. Nam
Samsung
Electronic engineering
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Considering physical mechanisms and geometry dependencies in 14nm FinFET circuit aging and product validations
2015
IEDM | International Electron Devices Meeting
Sangwoo Pae
Hyunchul Sagong
Changze Liu
Minjung Jin
Y. H. Kim
Seungjin Choo
J. J. Kim
Hyoung-joon Kim
Sungyoung Yoon
H. W. Nam
Hyewon Shim
S.M. Park
Jungsik Park
S C. Shin
Ju-Seop Park
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Citations (18)
42.4: Novel Manufacturing Process of TFT-LCD Featuring C/F on Array and Its Applications
2000
Jean‐Ho Song
S. G. Kim
H. W. Nam
S. G. Roh
J.H. Lee
D. S. Sakong
Jun-Hyung Souk
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Citations (6)
1