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Amritanshu Pandey
Amritanshu Pandey
Banaras Hindu University
Transistor
Gate oxide
MOSFET
CMOS
Threshold voltage
1
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Analysis and impacts of Negative Bias Temperature Instability (NBTI)
2012
EECS | IEEE Students Conference on Electrical, Electronics and Computer Science
Rajeev Mishra
Amritanshu Pandey
Sarfraz Alam
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