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A. Mukai
A. Mukai
Toshiba
Optoelectronics
Gate dielectric
Deposition (law)
Physics
Logic gate
2
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Highly Reliable GaN-MOSFETs with High Channel Mobility Gate by Selective-Area Crystallization
2020
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Yosuke Kajiwara
Aya Shindome
A. Mukai
Hiroshi Ono
Daimotsu Kato
Masahiko Kuraguchi
Shinya Nunoue
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Improvement of positive bias temperature instability characteristic in GaN MOSFETs by control of impurity density in SiO 2 gate dielectric
2017
IEDM | International Electron Devices Meeting
Toshiya Yonehara
Yosuke Kajiwara
Daimotsu Kato
Kenjiro Uesugi
T. Shimizu
Y. Nishida
H. Ono
Aya Shindome
A. Mukai
A. Yoshioka
Masahiko Kuraguchi
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